Effect of line broadening mechanisms on resonance Raman excitation profiles: A possible method for measuring short lifetimes
- 1 April 1976
- journal article
- Published by Elsevier in Chemical Physics Letters
- Vol. 39 (1), 11-13
- https://doi.org/10.1016/0009-2614(76)85184-6
Abstract
No abstract availableKeywords
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