The application of stereographic techniques to the scanning electron microscope
- 1 July 1969
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 2 (7), 565-569
- https://doi.org/10.1088/0022-3735/2/7/303
Abstract
A stereographic technique has been developed for the accurate determination of the dimensions of features on scanning electron micrographs. More general methods than those used previously are shown to be necessary largely because of the wide range of operating angles available in the scanning electron microscope. An experimental verification of the method is described which shows that results accurate to ±5% can be obtained, without precision measuring equipment.Keywords
This publication has 2 references indexed in Scilit:
- Correction of errors in electron stereomicroscopyBritish Journal of Applied Physics, 1960
- Sources of error in electron stereomicroscopyBritish Journal of Applied Physics, 1958