Einfluß der Oberflächenbearbeitung auf die Röntgenstrahl‐Totalreflexionsprofile
- 1 January 1975
- journal article
- research article
- Published by Wiley in Crystal Research and Technology
- Vol. 10 (10), 1063-1066
- https://doi.org/10.1002/crat.19750101009
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- The non-specular scattering of X-rays from thin filmsJournal of Applied Crystallography, 1970
- Some Observations on the Interference Fringes Formed by X Rays Scattered from Thin FilmsPhysical Review B, 1966
- Origin of Anomalous Surface Reflection of X RaysPhysical Review B, 1965
- Interpretation of the Anomalous Surface Reflection of X RaysJournal of Applied Physics, 1965
- Anomalous Surface Reflection of X RaysPhysical Review B, 1963