High Dispersion Electron Diffraction by Primary Magnification

Abstract

A method for attaining high dispersion in electron diffraction is presented. High dispersion may be obtained by primary magnification of a diffraction pattern formed in the normal manner at the object plane of a magnetic or electrostatic lens. Dispersion may be varied continuously by changing the lens current or voltage. The design of diffraction cameras of this type is discussed and their value in diffraction problems pointed out. The validity of the method is established by diffraction patterns obtained using a modified electron microscope adapter.