Magnetoreflectance and magnetization of the semimagnetic semiconductorSe
- 15 September 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 46 (12), 7537-7541
- https://doi.org/10.1103/physrevb.46.7537
Abstract
Magnetoreflectance measurements of excitonic interband transitions are used to study the exchange interaction between band electrons and localized Fe d electrons in cubic Se (x<0.06) at T=1.9 K and B<5 T. Combining exciton splitting with the magnetization of the same samples, we determined the conduction- and valence-band exchange constants α=0.25 eV and β=-1.76 eV.
Keywords
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