A dynamic control and measuring system for synchrotron X-ray rocking curves
- 15 April 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 208 (1-3), 613-619
- https://doi.org/10.1016/0167-5087(83)91193-6
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Remeasurement of γ-Ray reference linesAnnals of Physics, 1980
- The measurement of the X-ray scattering factors of silicon from the fine structure of Laue-case rocking curvesJournal of Applied Crystallography, 1980
- Order sorting, focusing and polarizing monolithic monochromators for synchrotron radiationNuclear Instruments and Methods, 1980
- A double-crystal X-ray spectrometer stabilised by a dynamic feedback systemJournal of Physics E: Scientific Instruments, 1979
- A capacitance-based micropositioning system for x-ray rocking curve measurementsReview of Scientific Instruments, 1979
- Electronic micropositioning with ferroelastic–ferroelectricsReview of Scientific Instruments, 1978
- Piezodriven 50-μm range stage with subnanometer resolutionReview of Scientific Instruments, 1978
- Double-crystal, vacuum x-ray diffractometerReview of Scientific Instruments, 1977
- Linearity of capacitance displacement transducersReview of Scientific Instruments, 1975
- Observation of internal x-ray wave fields during Bragg diffraction with an application to impurity lattice locationPhysical Review B, 1974