Method and spectrometer for measuring optical absorption in thin epitaxial layers
- 1 June 1976
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 9 (6), 484-487
- https://doi.org/10.1088/0022-3735/9/6/018
Abstract
A non destructive method and an apparatus are described which can be used to measure the optical absorption coefficient in thin semiconductor layers. By using a long optical path length, absorption coefficients of the order of 0.05 cm-1 can be measured.Keywords
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- Geometrical properties of random particles and the extraction of photons from electroluminescent diodesJournal of Applied Physics, 1974
- Light-emitting diodesProceedings of the IEEE, 1972