Energetics of Silicide Interface Formation
- 10 June 1985
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 54 (23), 2517-2520
- https://doi.org/10.1103/PhysRevLett.54.2517
Abstract
The energetics of the early growth stages of epitaxial Ni on Si have been investigated by use of local-density-functional theory implemented as the linear-augmented-plane-wave method. We find that a proposed diffusion region of interstitial Ni several atomic layers thick is highly unfavorable energetically. The energy difference between interstitial and reacted Ni at monolayer coverage calculated for a (111) surface is less, but still large enough to argue strongly against a significant intersitial concentration for any surface.
Keywords
This publication has 20 references indexed in Scilit:
- Electronic structure and properties of Ni-Si(001) and Ni-Si(111) reactive interfacesPhysical Review B, 1984
- Structure and Nucleation Mechanism of Nickel Silicide on Si(111) Derived from Surface Extended-X-Ray-Absorption Fine StructurePhysical Review Letters, 1983
- Formation of Ultrathin Single-Crystal Silicide Films on Si: Surface and Interfacial Stabilization of Si-NiEpitaxial StructuresPhysical Review Letters, 1983
- Theory of static structural properties, crystal stability, and phase transformations: Application to Si and GePhysical Review B, 1982
- Diffusion-layer microstructure of Ni on Si(100)Physical Review B, 1982
- Metal/silicon interface formation: The Ni/Si and Pd/Si systemsJournal of Vacuum Science and Technology, 1981
- Lattice-Location Experiment of the Ni-Si Interface by Thin-Crystal Channeling of Helium IonsPhysical Review Letters, 1981
- Selective growth of metal-rich silicide of near-noble metalsApplied Physics Letters, 1975
- Self-Consistent Equations Including Exchange and Correlation EffectsPhysical Review B, 1965
- Inhomogeneous Electron GasPhysical Review B, 1964