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Picosecond and subpicosecond optoelectronics for measurements of future high speed electronic devices
Home
Publications
Picosecond and subpicosecond optoelectronics for measurements of future high speed electronic devices
Picosecond and subpicosecond optoelectronics for measurements of future high speed electronic devices
JV
J.A. Valdmanis
J.A. Valdmanis
GM
G.A. Mourou
G.A. Mourou
CG
C.W. Gabel
C.W. Gabel
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1 January 1983
proceedings article
Published by
Institute of Electrical and Electronics Engineers (IEEE)
https://doi.org/10.1109/iedm.1983.190577
Abstract
No abstract available
Keywords
FREQUENCY
VOLTAGE
TRAVELING WAVE
SIGNAL PROCESSING
Cited by 1 article