Detection and characterization of longitudinal field for tip-enhanced Raman spectroscopy
- 20 December 2004
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 85 (25), 6239-6241
- https://doi.org/10.1063/1.1839646
Abstract
We characterized the longitudinal field formed at a tightly focused spot by a high numerical aperture objective lens using a tip-enhanced near-field microscope. The longitudinal field efficiently excites the localized surface plasmon polaritons at the metallic tip apex resulting in an electric field enhancement. Radially polarized light generated by a combination of four half-waveplates successfully increases the longitudinal field resulting in higher sensitivity for tip-enhanced Raman spectroscopy of adenine nanocrystals.Keywords
This publication has 21 references indexed in Scilit:
- Tip-enhanced near-field Raman analysis of tip-pressurized adenine moleculePhysical Review B, 2004
- Detection of an individual single-wall carbon nanotube by tip-enhanced near-field Raman spectroscopyChemical Physics Letters, 2003
- High-Resolution Near-Field Raman Microscopy of Single-Walled Carbon NanotubesPhysical Review Letters, 2003
- Near-field Raman imaging of organic molecules by an apertureless metallic probe scanning optical microscopeThe Journal of Chemical Physics, 2002
- Near-field Raman scattering enhanced by a metallized tipChemical Physics Letters, 2001
- Near-Field Optics and Surface Plasmon PolaritonsPublished by Springer Nature ,2001
- Metallized tip amplification of near-field Raman scatteringOptics Communications, 2000
- Locally enhanced Raman spectroscopy with an atomic force microscopeApplied Physics Letters, 2000
- Nanoscale chemical analysis by tip-enhanced Raman spectroscopyChemical Physics Letters, 2000
- Near-field scanning optical microscope using a metallized cantilever tip for nanospectroscopyPublished by SPIE-Intl Soc Optical Eng ,1999