Distinction of intrinsic from extrinsic stacking faults in field-ion micrographs
- 1 May 1969
- journal article
- other
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 19 (161), 1083-1084
- https://doi.org/10.1080/14786436908225874
Abstract
The conventional rules for the construction of Burgers circuits can be applied to dislocations and stacking faults observed in field-ion micrographs and will permit distinction of intrinsic and extrinsic faults in some cases.Keywords
This publication has 3 references indexed in Scilit:
- On distinguishing between intrinsic and extrinsic faults in field-ion micrographsPhilosophical Magazine, 1969
- The analysis of field-ion micrographs: Stacking faults in tungstenPhilosophical Magazine, 1968
- Contrast from stacking faults and partial dislocations in the field-ion microscopePhilosophical Magazine, 1968