Nanocalorimeter for high resolution measurements of low temperature heat capacities of thin films and single crystals
- 1 November 1997
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 68 (11), 4191-4195
- https://doi.org/10.1063/1.1148366
Abstract
An innovative nanocalorimeter has been developed for measuringspecific heats of thin films,multilayers (typical thickness: 1000 Å) and single crystals (mass: 1 μg) in the temperature range of 1.5–20 K. The addenda of the device are as small as 3 nJ/K at 4 K (0.5 nJ/K at 1.5 K), thus samples with a heat capacity of the order of nJ/K at 4 K can be measured.Heat capacity differences as a function of temperature or an external magnetic field (5 T) were determined with a resolution of ΔC/C≃10 −4 . This way we have seen heat capacity variations of less than a pJ/K. We present as an example measurements on very small Mn 12 O 12 acetate single crystals and a measurement of a thin superconducting Pb layer. In the latter measurement we could evidence via specific heat a finite size effect.Keywords
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