Characterization of epitaxial films by grazing-incidence X-ray diffraction
- 1 November 1987
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 154 (1-2), 33-42
- https://doi.org/10.1016/0040-6090(87)90349-x
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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