Structure of Spherulites as Revealed by Selected-Area Electron Diffraction and Electron Microscopy
- 1 October 1957
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 28 (10), 1089-1090
- https://doi.org/10.1063/1.1722583
Abstract
Two‐dimensional spherulites in thin films of the 6–6 nylon have been studied by selected‐area electron diffraction, bright‐field and dark‐field electron microscopy. The electron diffraction patterns were found to be comparable to studies using limited area x‐ray diffraction. In this sample they showed that the molecules were arranged in sheets with the hydrogen bonds in the plane of the film. Large field areas were used and as a result no preferred direction of orientation was seen. However, in dark‐field electron microscopy, by using only those Bragg electrons scattered into limited portions of the principle rings, the radical growth and branching of discrete crystalline regions was seen. Bright field electron microscopy showed the surface morphology of these structures.Keywords
This publication has 2 references indexed in Scilit:
- Texture of some crystalline synthetic polymers by electron microscopyJournal of Polymer Science, 1953
- Morphology of Crystalline Synthetic PolymersNature, 1953