Measurement of the CdSe/ZnTe valence band offset by x-ray photoelectron spectroscopy
- 1 July 1991
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 9 (4), 2233-2237
- https://doi.org/10.1116/1.585726