Abstract
Measurements of the temperature dependence of the electrical resistivity of strained and annealed samples of very pure Ag between 1.4 and 295 °K have permitted the unambiguous and precise determination of the ideal resistivity ρi and of the deviation from Matthiessen's rule ρM. Between 12 and 23 °K, ρi varies as[Formula: see text]and has been attributed to normal and umklapp scattering. Below 10 °K an additional term with a T3.86 ± 0.08 behavior appears and is attributed to one-step umklapp scattering. For samples with [Formula: see text], [Formula: see text] over the entire temperature range. Below 10 °K the variation of ρM with temperature and with defect concentration is described in terms of the theory of phonon-assisted defect scattering proposed by Klemens.