Transport in Relaxation Semiconductors
- 16 July 1973
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 31 (3), 153-154
- https://doi.org/10.1103/physrevlett.31.153
Abstract
The Van Roosbroeck model for the exhaustion of majority carriers by the injection of minority carriers is shown to lead to an inconsistency in the requirement of the continuity of the current. The assumed exhaustion of majority carriers by this mechanism has therefore to be ruled out.Keywords
This publication has 1 reference indexed in Scilit:
- Transport in Relaxation SemiconductorsPhysical Review B, 1972