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Test of the thermal-noise hypothesis in m.o.s.f.e.t.s
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Test of the thermal-noise hypothesis in m.o.s.f.e.t.s
Test of the thermal-noise hypothesis in m.o.s.f.e.t.s
HH
H.E. Halladay
H.E. Halladay
AZ
A. van der Ziel
A. van der Ziel
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1 January 1968
journal article
Published by
Institution of Engineering and Technology (IET)
in
Electronics Letters
Vol. 4
(17)
,
366-367
https://doi.org/10.1049/el:19680287
Abstract
Evidence is given that, for m.o.s.f.e.t.s, another source o noise besides thermal noise must be operating in the conducting channel.
Keywords
TRANSISTORS
THERMAL NOISE
NOISE
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Cited by 9 articles