A field ion microscope for operation at 4.2 K

Abstract
A field ion microscope for use at liquid helium temperatures is described and some operating results are given. The microscope is constructed of stainless steel with one metal-to-glass seal far removed from the low temperature part of the microscope. A micrograph obtained with this microscope is included. The use of liquid helium in place of liquid nitrogen improves the resolution and intensity of the image, while its use as opposed to liquid hydrogen increases the safety of operation.

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