X-ray reflectivity of a Langmuir monolayer on water
- 1 January 1987
- journal article
- Published by EDP Sciences in Revue de Physique Appliquée
- Vol. 22 (8), 775-778
- https://doi.org/10.1051/rphysap:01987002208077500
Abstract
We built a special Langmuir through allowing the use of X-ray reflectivity. Using the device we studied for the first time the density profile of a Langmuir monolayer directly on water. This experiment opens new prospects in particular to measure the roughness of solid films on water subphaseKeywords
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