Al Surface Relaxation Using Surface Extended X-Ray-Absorption Fine Structure
- 8 January 1979
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 42 (2), 104-108
- https://doi.org/10.1103/physrevlett.42.104
Abstract
The surface extended x-ray-absorption fine structure (EXAFS) of a single crystal has been measured for the first time. By comparison with parameters obtained from bulk aluminum EXAFS, a decrease of the interatomic distance ( Å) at the Al(111) surface has been found. No relaxation is found of the Al-Al separation on the (100) face.
Keywords
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