VLSI Electrically Erasable Programmable Read Only Memory
- 1 January 1985
- book chapter
- Published by Elsevier
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Reliability Aspects of a Floating Gate E2 PROM8th Reliability Physics Symposium, 1981
- Fowler-Nordheim Tunneling into Thermally Grown SiO2Journal of Applied Physics, 1969