Stress-Induced Shifts of First-Order Raman Frequencies of Diamond- and Zinc-Blende-Type Semiconductors

Abstract
In this paper we report measurements of the effects of large static uniaxial stress along [001], [111], and [110] on the frequency of the k0 optical phonons in Ge, GaAs, GaSb, InAs, and ZnSe using first-order Raman scattering. In the absence of stress, the first-order Stokes-Raman spectrum of diamond-type materials exhibits a single peak which corresponds to the k0 triply degenerate optical phonons (F2g or Γ25) while the zinc-blende materials exhibit two peaks, corresponding to the k0 LO and TO phonons. The application of the uniaxial stress causes polarization-dependent splittings and/or shifts which are linear in the stress. From these observed splittings and shifts we have obtained experimental values for the phenomenological coefficients (p, q, r) which describe the changes in the "spring constant" of these optical phonons with strain. Comparison of the experimental values is made with several theoretical considerations based on bond-stretching and bond-bending interactions between atoms. The shift due to the hydrostatic component of the strain yields a value for the mode-Grüneisen parameter, which is compared with the results of hydrostatic-pressure measurements. For the zinc-blende-type materials, the doubly degenerate TO-phonon line exhibits both a splitting and shift with stress, while only a shift is observed for the singlet LO-phonon line. In the case of the III-V compounds, one of the split TO lines has a stress dependence equal to that of the LO-phonon line, while this is not the case for the group II-VI material (ZnSe) we have investigated. This latter result is interpreted in terms of the stress dependence of the effective charge.