Characterization of Multiple Parallel Transmission Lines Using Time Domain Reflectometry
- 1 January 1969
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 18 (3), 166-171
- https://doi.org/10.1109/TIM.1969.4313795
Abstract
Two methods of using time domain reflectometry for the characterization of a system of multiple parallel transmission lines are described. The two methods are the reflection method and the direct method. The selection of a method depends on the accuracy required and the property of the system of transmission lines to be measured: [Y0], [Z0], [C], or [L].Keywords
This publication has 1 reference indexed in Scilit:
- Time-domain analysis of multiple parallel transmission lines by means of equivalent circuitsElectronics Letters, 1967