A model of ohmic contacts to semiconductors
- 30 September 1975
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 18 (9), 791-798
- https://doi.org/10.1016/0038-1101(75)90159-8
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Current-voltage characteristics of silicon metallic-silicide interfacesSolid-State Electronics, 1975
- A detailed analysis of the metal-semiconductor contactSolid-State Electronics, 1974
- New Quantum and Electronic Theory of Metal-Semiconductor ContactsPhysical Review B, 1973
- Current transport in metal semiconductor contacts—a unified approachSolid-State Electronics, 1972
- Recombination velocity effects on current diffusion and imref in schottky barriersSolid-State Electronics, 1971
- Quantum and temperature effects on capacitance in degenerate P-N junctionsSolid-State Electronics, 1970
- Current transport in metal-semiconductor barriersSolid-State Electronics, 1966
- Electron-optical-phonon scattering in the emitter and collector barriers of semiconductor-metal-semiconductor structuresSolid-State Electronics, 1965
- Electron-phonon collector backscattering in hot electron transistorsSolid-State Electronics, 1965
- Halbleitertheorie der SperrschichtThe Science of Nature, 1938