Birth-Death and Bug Counting
- 1 April 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-32 (1), 37-47
- https://doi.org/10.1109/tr.1983.5221472
Abstract
Many software reliability time-domain bug-counting models are, as fault counters, special cases of the stochastic process known as the death process. Generalization to a nonhomogeneous birth-death process achieves three ends: stochastic fault introduction, the synthesis of a time-dependent failure rate with imperfect debugging and fault introduction, and the mathematical unification of much bug-counting theory. Often, the price for generalization is mathematical intractability. Yet useful and tractable reliability measures with strong intuitive appeal are derived. The paper opens with a brief general discussion of software reliability and a selective review of some bug-counting models. Thereafter, the fundamental concepts and equations of a birth-death process are presented and applied to software reliability modeling. Assumptions for this application are then dealt with at some length. Reliability measures-initial, present, and future - are developed. Finally. the practical application of the model in the reliability assessment of a software package is discussed.Keywords
This publication has 3 references indexed in Scilit:
- Stochastic Reliability-Growth: A Model for Fault-Removal in Computer-Programs and Hardware-DesignsIEEE Transactions on Reliability, 1981
- Validity of Execution-Time Theory of Software ReliabilityIEEE Transactions on Reliability, 1979
- SOFTWARE RELIABILITY RESEARCHPublished by Elsevier ,1972