Optical filters: Monitoring process allowing the auto-correction of thickness errors
- 1 November 1972
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 13 (2), 285-290
- https://doi.org/10.1016/0040-6090(72)90297-0
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Contr le et r alisation de rev tements multidi lectriques pr sentant des caract ristiques spectrales impos esNouvelle Revue d'Optique Appliquée, 1972
- Tolerances For Layer Thicknesses in Dielectric Multilayer Coatings and Interference Filters.Journal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1960
- Design of Multilayer Filters by Considering Two Effective InterfacesJournal of the Optical Society of America, 1958