TEM Observation of Segregated Microstructure in Sputtered Co–Cr Film
- 1 August 1986
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 25 (8A), L668-670
- https://doi.org/10.1143/jjap.25.l668
Abstract
TEM observation of the segregated microstructure in sputtered Co–Cr films was conducted. The specific segregated microstructure was observed in the film composition range of 15.3–24.3 at%Cr–Co. The results present a new model for the origin of the segregation where two-phase separation into magnetic and non-magnetic phases occurs in a single hcp phase. The ferromagnetic Co-rich regions in a crystallite are supposed to be embedded in nonmagnetic Cr-rich matrix, with a wall-like figure perpendicular to the substrate plane.Keywords
This publication has 10 references indexed in Scilit:
- TEM Observation of Microstructure in Sputtered Co-Cr FilmJapanese Journal of Applied Physics, 1985
- Compositional microstructure of perpendicular magnetic rcording media.Journal of the Magnetics Society of Japan, 1985
- Effect of atomic distribution on the saturation magnetization of cobalt-chromium filmsJournal of Applied Physics, 1984
- Evidence for microstructural inhomogeneity in sputtered Co-Cr thin filmsJournal of Applied Physics, 1984
- A comparison of the uniaxial anisotropy in sputtered Co–Re and Co–Cr perpendicular recording mediaJournal of Applied Physics, 1983
- Perpendicular magnetization structure of Co-Cr filmsIEEE Transactions on Magnetics, 1982
- Computer Calculation of Phase Diagrams of Co-Cr and Co-Mn SystemsJournal of the Japan Institute of Metals and Materials, 1982
- Magnetic and structural properties of Rh substituted Co-Cr alloy films with perpendicular magnetic anisotropyJournal of Applied Physics, 1981
- Perpendicular magnetic recording with a composite anisotropy filmIEEE Transactions on Magnetics, 1979
- Co-Cr recording films with perpendicular magnetic anisotropyIEEE Transactions on Magnetics, 1978