Uncertainties in thick-target PIXE analysis
- 1 July 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 212 (1), 427-439
- https://doi.org/10.1016/0167-5087(83)90725-1
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- Uncertainties in theoretical thick target PIXE yieldsNuclear Instruments and Methods in Physics Research, 1981
- Thick target pixe analysis and yield curve calculationsNuclear Instruments and Methods, 1981
- PIXE calibration and correction of matrix effects in the case of thick samplesNuclear Instruments and Methods, 1981
- A semiempirical procedure for the simple calculation of the signal intensity in Pixe analysis of thick samplesNuclear Instruments and Methods, 1981
- Proton induced X-ray emission (PIXE) analysis on thick samples exemplified on the rare earth elementsAnalytical and Bioanalytical Chemistry, 1981
- Proton induced X-ray emission (PIXE) analysis on thick samples exemplified on the rare earth elementsAnalytical and Bioanalytical Chemistry, 1981
- X-ray analysis of thick targets with α-particlesNuclear Instruments and Methods, 1978
- Proton-induced X-ray emission analysis of thick and thin targetsNuclear Instruments and Methods, 1977
- Quantitative analysis of complex targets by proton-induced x raysJournal of Applied Physics, 1975
- Quantitative trace element analyses in thick samples with heavy-ion-induced x-ray fluorescenceJournal of Applied Physics, 1973