Forward Voltage—Current Characteristics of Metal—Silicon Schottky Barriers
- 1 February 1967
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 38 (2), 891-892
- https://doi.org/10.1063/1.1709439
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Graphical Determination of the Barrier Height and Excess Temperature of a Schottky BarrierJournal of Applied Physics, 1966
- Experimental Study of Gold-Gallium Arsenide Schottky BarriersJournal of Applied Physics, 1965
- The Richardson constant for thermionic emission in Schottky barrier diodesSolid-State Electronics, 1965
- Photoelectric Determination of the Image Force Dielectric Constant For Hot Electrons in Schottky BarriersJournal of Applied Physics, 1964
- Conduction properties of the Au-n-type—Si Schottky barrierSolid-State Electronics, 1963