Instrumental data for the Elmiskop 101 electron microscope

Abstract

Instrumental constants, not included in the manufacturer's handbook for the Siemens Elmiskop 101 electron microscope, are reported. The contents refer to image-to-diffraction and image-to-specimen rotation, magnification and diffraction camera calibration. Comments are also made on the use of the electromagnetic beam tilt for dark field work and on the use of rotating specimen holders.