Successive oxidation stages and annealing behavior of the Si(111) 7×7 surface observed with scanning tunneling microscopy and scanning tunneling spectroscopy
- 1 March 1991
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 9 (2), 775-778
- https://doi.org/10.1116/1.585509