A technique for comparing the bulk and surface structure of defects in thin films using the scanning transmission electron microscope.
- 1 March 1981
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 38 (5), 341-343
- https://doi.org/10.1063/1.92370
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Thermal strain in lead thin films IV: Effects of multiple cycling to 4.2 KThin Solid Films, 1979
- Method for examining solid specimens with improved resolution in the scanning electron microscope (SEM)Applied Physics Letters, 1973
- Low-Loss Image for Surface Scanning Electron MicroscopeApplied Physics Letters, 1971
- Effect of thermal diffuse scattering on propagation of high energy electrons through crystalsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1965