EXAFS of ultra thin layers of Cu
- 28 October 1978
- journal article
- Published by IOP Publishing in Journal of Physics C: Solid State Physics
- Vol. 11 (20), L833-L836
- https://doi.org/10.1088/0022-3719/11/20/003
Abstract
It is shown that extended X-ray absorption fine structure (EXAFS) experiments employing fluorescence detection can be performed readily upon ultra thin films ( approximately 30 AA) of metals in run times of the order of one hour, with conventional sources. The EXAFS oscillations of Cu films 200 AA in thickness are found to be nearly identical to those of the bulk, while the oscillations of films 30 AA in thickness are similar to those of CuO.Keywords
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