The determination of atomic positions in high-resolution electron micrographs
- 31 December 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 18 (1-4), 39-47
- https://doi.org/10.1016/0304-3991(85)90120-2
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Sign conventions in electron diffraction and imagingUltramicroscopy, 1984
- Elastic strain at the solid-solid interface in intergrowth structures : A novel example of partial structure refinement by HREMMaterials Research Bulletin, 1984
- Accurate atomic positions from electron microscopyNature, 1984
- Three-dimensional reconstruction of imperfect two-dimensional crystalsUltramicroscopy, 1984
- The importance of beam alignment and crystal tilt in high resolution electron microscopyUltramicroscopy, 1983
- The analytical representation of atomic scattering amplitudes for electronsActa Crystallographica, 1962