Error log analysis: statistical modeling and heuristic trend analysis
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 39 (4), 419-432
- https://doi.org/10.1109/24.58720
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- The Discrete Weibull DistributionIEEE Transactions on Reliability, 1975
- An Approach to the Diagnosis of Intermittent FaultsIEEE Transactions on Computers, 1975
- Testing for Intermittent Faults in Digital CircuitsIEEE Transactions on Computers, 1973