Fabrication of thin-film metal nanobridges
- 4 December 1989
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 55 (23), 2459-2461
- https://doi.org/10.1063/1.102001
Abstract
Thin‐film fabrication techniques for forming three‐dimensional ‘‘point contacts’’ are presented. As‐fabricated nanobridges can be modified using electromigration to make the constriction region smaller or dirtier. Scientific applications to quantum transport studies, 1/f noise, and electromigration are discussed.Keywords
This publication has 5 references indexed in Scilit:
- Defect Interactions and Noise in Metallic NanoconstrictionsPhysical Review Letters, 1988
- Rectification and harmonic generation with metal-insulator-metal diodes in the mid-infraredApplied Physics Letters, 1983
- Point-contact spectroscopy in metalsJournal of Physics C: Solid State Physics, 1980
- Anisotropic etching of siliconIEEE Transactions on Electron Devices, 1978
- Niobium point-contact Josephson-junction behavior at 604 GHzApplied Physics Letters, 1977