Secondary ion mass spectrometry by time-of-flight
- 20 September 1983
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 53, 125-134
- https://doi.org/10.1016/0020-7381(83)85107-9
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Time-of-flight mass spectrometry for ions of large energy spreadInternational Journal of Mass Spectrometry and Ion Physics, 1983
- Multiphoton mass spectrometry of metastables: direct observation of decay in a high-resolution time-of-flight instrumentThe Journal of Physical Chemistry, 1982
- Electrospray loading of field desorption emitters and desorption chemical ionization probesAnalytical Chemistry, 1982
- Fission fragment ionization mass spectrometry: Metastable decompositionsInternational Journal of Mass Spectrometry and Ion Physics, 1981
- A time-of-flight mass spectrometer for measurement of secondary ion mass spectraInternational Journal of Mass Spectrometry and Ion Physics, 1981
- Thin film deposition by the electrospray method for californium-252 plasma desorption studies of involatile moleculesAnalytical Chemistry, 1979
- Spaltfragment-induzierte Desorptions-Massenspektrometrie nichtflüchtiger dünnschicht0chromatographisch getrennter SubstanzenChromatographia, 1977
- 252Cf-plasma desorption time-of-flight mass spectrometryInternational Journal of Mass Spectrometry and Ion Physics, 1976
- Time-of-Flight Mass Spectrometer with Improved ResolutionReview of Scientific Instruments, 1955
- The electrical dispersion of liquids as aerosolsJournal of Colloid Science, 1955