Remote sensing estimators of potential and actual crop yield
- 1 September 1983
- journal article
- research article
- Published by Elsevier in Remote Sensing of Environment
- Vol. 13 (4), 301-311
- https://doi.org/10.1016/0034-4257(83)90032-9
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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- Multidate spectral reflectance as predictors of yield in water stressed wheat and barleyInternational Journal of Remote Sensing, 1981
- Remote sensing of total dry-matter accumulation in winter wheatRemote Sensing of Environment, 1981
- Estimation of grain yields by remote sensing of crop senescence ratesRemote Sensing of Environment, 1980
- Test of the Stress‐Degree‐Day Concept Using Multiple Planting Dates of Red Kidney BeansAgronomy Journal, 1979
- Wheat yield estimation by albedo measurementRemote Sensing of Environment, 1978
- Effect of environment and cultivar on source limitation to grain weight in wheatAustralian Journal of Agricultural Research, 1978
- Remote-Sensing of Crop YieldsScience, 1977
- Yield Potential in a Dwarf Spring Wheat and the Effect of Shading1Crop Science, 1975