Filamentary Conduction in VO2 Coplanar Thin-Film Devices
- 15 August 1971
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 19 (4), 115-117
- https://doi.org/10.1063/1.1653835
Abstract
Filaments have been observed in VO2 coplanar thin‐film devices and their I‐V characteristic investigated. An analysis of the evolution of the temperature profile in the VO2 film is given.Keywords
This publication has 5 references indexed in Scilit:
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- Characteristics of Semiconducting Glass Switching/Memory DiodesIBM Journal of Research and Development, 1969
- Thermal filaments in vanadium dioxideIEEE Transactions on Electron Devices, 1969