Auger-Plasmon-Satellite Intensities versus Depth—A Means for Determining Adatom Concentration Profiles
- 15 March 1973
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 7 (6), 2305-2317
- https://doi.org/10.1103/physrevb.7.2305
Abstract
Exit-angle-dependent and angle-integrated Auger-plasmon-satellite intensities are calculated as a function of depth of the Auger emitter into a (Jellium) metal substrate, and as a function of Auger-line energy. The use of measurements of such intensities is proposed as a means of determining the concentration of adatoms versus atomic layer in adsorption experiments.Keywords
This publication has 17 references indexed in Scilit:
- A means for distinguishing if an adatom is above or below a substrate surfaceSurface Science, 1972
- Microscopic Description of Electron-Solid Interactions at a SurfacePhysical Review B, 1972
- Excitation of Collective Modes in Electron–Solid and Ion–Solid ScatteringJournal of Vacuum Science and Technology, 1972
- Use of Auger Electron Spectroscopy and Inert Gas Sputtering for Obtaining Chemical ProfilesJournal of Vacuum Science and Technology, 1972
- Characteristic energies in secondary electron spectra from Si(111) surfacesSurface Science, 1971
- Observation of a plasmon-gain in the fine structure of the aluminium Auger spectrumJournal of Physics F: Metal Physics, 1971
- Deconvolution techniques in Auger electron spectroscopySurface Science, 1971
- Thin reaction layers and the surface structure of silicon (111)Surface Science, 1969
- Angular dependences in electron-excited auger emissionSurface Science, 1969
- Simple Microscopic Theory of Surface PlasmonsPhysical Review B, 1968