Renormalization-group analysis of layering transitions in solid films

Abstract

The layering critical points of a multilayer absorbed solid film are examined with the use of a renormalization group. The critical temperature $T_{c,n}$, of the $n$th layering transition will, for large $n$, be less than the roughening temperature, $T_R$, of the corresponding interface between bulk phases by an amount proportional to $\frac{1}{\mathrm{l}{\mathrm{n}}^{2}n}$. The layering critical points are in the universality class of the two-dimensional Ising model.