Secondary-ion and electron production from surfaces bombarded by large polyatomic ions
- 1 February 1992
- journal article
- research article
- Published by Wiley in Rapid Communications in Mass Spectrometry
- Vol. 6 (2), 147-157
- https://doi.org/10.1002/rcm.1290060215
Abstract
No abstract availableKeywords
This publication has 34 references indexed in Scilit:
- Massive cluster impact mass spectrometry: A new desorption method for the analysis of large biomoleculesRapid Communications in Mass Spectrometry, 1991
- Collisions of polyatomic ions with surfacesInternational Journal of Mass Spectrometry and Ion Processes, 1990
- Ion/surface collision phenomena in an improved tandem time-of-flight instrumentInternational Journal of Mass Spectrometry and Ion Processes, 1989
- Desorption of valine molecular ions using fast incident atomic and polyatomic ionsInternational Journal of Mass Spectrometry and Ion Processes, 1988
- Matrix-assisted ultraviolet laser desorption of non-volatile compoundsInternational Journal of Mass Spectrometry and Ion Processes, 1987
- Larger cluster ion impact phenomenaChemical Reviews, 1986
- Improved detection of large rare-gas cluster ionsReview of Scientific Instruments, 1983
- Threshold studies of secondary electron emission induced by macro-ion impact on solid surfacesNuclear Instruments and Methods, 1980
- A time-zero detector utilizing isochronous transport of secondary electronsNuclear Instruments and Methods, 1977
- Calculations of nuclear stopping, ranges, and straggling in the low-energy regionPhysical Review B, 1977