Rapid-frequency-scan laser for instantaneous line-profile measurements in fluorescence spectroscopy
- 1 May 1987
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 58 (5), 759-764
- https://doi.org/10.1063/1.1139627
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Velocity-Distribution Functions of Sputtered Atoms Caused by Insufficiently Developed Collision-CascadesJapanese Journal of Applied Physics, 1986
- Transient Change in the Velocity Distribution Functions of Sputtered Atoms during Initial Dose in Ion-Beam BombardmentJapanese Journal of Applied Physics, 1986
- A Proposal for Local Magnetic-Field Measurement in High-Temperature Plasma Devices Using a Rapid-Frequency-Scan LaserJapanese Journal of Applied Physics, 1985
- Determination of velocity distribution of metallic atoms in plasma devices with a rapid-frequency-scan dye laserApplied Physics B Laser and Optics, 1984
- A rapid-frequency-scan laser for measurement of velocity distribution of impurities in plasmas by fluorescence spectroscopyJournal of Physics D: Applied Physics, 1983
- Transient effects in wavelength-modulated dye lasersApplied Physics Letters, 1975
- Rapid tuning of a dye laserOptics Communications, 1973
- Electronic Tuning of a Dye Laser Using the Acousto-Optic FilterApplied Physics Letters, 1971
- ANALYSIS OF A DYE LASER TUNED BY ACOUSTO-OPTIC FILTERApplied Physics Letters, 1970
- TUNABLE DYE LASER WITH NARROW SPECTRAL OUTPUTApplied Physics Letters, 1970