Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes
- 18 March 2002
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 80 (11), 1996-1998
- https://doi.org/10.1063/1.1452782
Abstract
The resolution and wear properties of carbon nanotube and etched-siliconatomic force microscopy probes are compared in intermittent-contact mode. Carbon nanotube probes have at least 20 times the life of etched-silicon probes and provide better resolution at all stages. Sample wear is minimized with carbon nanotube probes.Keywords
This publication has 7 references indexed in Scilit:
- Sharpened carbon nanotube probesPublished by SPIE-Intl Soc Optical Eng ,2000
- Tapping mode scanning force microscopy in water using a carbon nanotube probeUltramicroscopy, 1999
- Carbon nanotube-modified cantilevers for improved spatial resolution in electrostatic force microscopyApplied Physics Letters, 1999
- Buckling and Collapse of Embedded Carbon NanotubesPhysical Review Letters, 1998
- Nanotubes as nanoprobes in scanning probe microscopyNature, 1996
- Helical microtubules of graphitic carbonNature, 1991
- Atomic Force MicroscopePhysical Review Letters, 1986