Secondary ion yields produced by keV atomic and polyatomic ion impacts on a self-assembled monolayer surface
- 8 July 1999
- journal article
- Published by Wiley in Rapid Communications in Mass Spectrometry
- Vol. 13 (14), 1374-1380
- https://doi.org/10.1002/(sici)1097-0231(19990730)13:14<1374::aid-rcm645>3.0.co;2-5
Abstract
No abstract availableKeywords
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