On the quantitative measurement of the roughness spectrum of silver films
- 31 October 1974
- journal article
- Published by Elsevier in Surface Science
- Vol. 45 (2), 441-456
- https://doi.org/10.1016/0039-6028(74)90181-2
Abstract
No abstract availableKeywords
This publication has 39 references indexed in Scilit:
- Die bestimmung der oberflächenrauhigkeit dünner schichten durch messung der winkelabhängigkeit der streustrahlung von oberflächenplasmaschwingungenOptics Communications, 1974
- Absorption of light by surface plasmon excitationPhysics Letters A, 1968
- Plasma Radiation by Rough SurfacesPhysical Review Letters, 1967
- Plasma Radiation from Metal Grating SurfacesPhysical Review Letters, 1967
- Plasma Radiation from Thin Silver Foils Excited by LightPhysical Review Letters, 1965
- Transition Radiation, Bremsstrahlung und PlasmastrahlungThe European Physical Journal A, 1965
- Precise Method for Measuring the Absolute Phase Change on ReflectionJournal of the Optical Society of America, 1964
- Relation between the Height Distribution of a Rough Surface and the Reflectance at Normal IncidenceJournal of the Optical Society of America, 1963
- Specular Reflectance of Aluminized Ground Glass and the Height Distribution of Surface IrregularitiesJournal of the Optical Society of America, 1963
- Relation Between Surface Roughness and Specular Reflectance at Normal IncidenceJournal of the Optical Society of America, 1961