Auger electron spectroscopy investigations of the effect of degradation of depth resolution and its influence on the interdiffusion data in thin film Au/Ag, Cu/Ag, Pd/Au and Pd/Cu multilayer structures
- 1 May 2001
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 175-176, 790-796
- https://doi.org/10.1016/s0169-4332(01)00070-8
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
- AES studies of interdiffusion in thin-film copper–palladium multilayer structuresVacuum, 1999
- Auger electron spectroscopy studies of interdiffusion in electrodeposited amorphous Ni-P alloysSurface and Interface Analysis, 1994
- Auger electron spectroscopy investigations of segregation in AuPd and AgPd alloy thin filmsThin Solid Films, 1993
- AES depth profile studies of interdiffusion in the Ag-Cu bilayer and multilayer thin filmsPhysica Status Solidi (a), 1990
- Segregation and sputter effects on perfectly smooth (111) and (100) surfaces of Au-Ag alloys studied by AESPhysica Status Solidi (a), 1988
- Analysis of diffusion mechanisms in thin polycrystalline Au-Ag films using auger electron spectroscopySurface and Interface Analysis, 1983
- Auger study of preferred sputtering on Ag–Au alloy surfacesJournal of Vacuum Science and Technology, 1977
- A formalism for extracting diffusion coefficients from concentration profilesSurface Science, 1976
- Surface composition of binary systems. Prediction of surface phase diagrams of solid solutionsChemical Reviews, 1975
- SELF-DIFFUSION OF PALLADIUM IN SILVER-PALLADIUM ALLOYSThe Journal of Physical Chemistry, 1963