Escape depths of X-ray (MgKα)-induced photoelectrons and relative photoionization cross sections for the 3p subshell of the elements of the first long period

Abstract

Photoionization cross sections (Mg K alpha ) relative to F 1s=1.00 for the 3p subshell of the elements from K to Zn are deduced from XPS peak area measurements on a wide range of compounds using improved techniques. These cross sections are combined with photoelectron intensity comparisons between cleaned elemental surfaces to yield estimates of the escape depths (inelastic mean free paths) for 3p photoelectrons ( approximately 1200 eV energy) ejected from V, Cr, Fe, Co, Ni, Cu and Zn. The values obtained are compared with theoretical estimates.