Abstract
Through the electron mobility‐effective mass product, , used as a parameter in single‐band theory description of electron transport in a degenerated semiconductor, a new variable , the Seebeck quality factor is proposed for characterizing the quality of electronic transport within doped semiconductor alloys. This empirically defined variable, based upon acoustic vibrational mode and alloy scattering of electrons, provides a useful route for correlating the electron transport variables of Seebeck coefficient and electrical conductivity to structural‐chemical and process variables in bulk materials. The fundamental parameter of is reserved to characterize only the highest quality materials.